U12-S02. Measuring NP aggregation properties and surface area
Measuring NP aggregation properties and surface area
For this service, we offer a S3 MICRO instrument (Hecus X-ray Systems, Graz, Austria) for determinations of X-ray scattered intensity as a function of scattering angle. This instrument is equipped with a GENIX microfocus X-ray source and a FOX 2D point-focusing element (both from Xenocs, Grenoble). It can measure simultaneously at small angle (0,2º-8º) and wide angle (18°-28°).
We also offer a Quantachrome Autosorb iQ-AG equipment that provides gas adsorption/desorption curves, for the calculation of specific surface area and pore size analysis. This equipment allows the simultaneous degassing of two samples and the physisorption analysis of a third sample, at relative pressures above P/P0 > 1×10-3. The gas sorption analyzer is equipped with a cryogenic dewar for measurements until 90 hours.
Customer benefits
- Specialized in colloidal samples
- ISO9001 certification for standard quality control system
- Highly qualified and continuously trained staff
- Adapted to customers’ needs
The services provided by the unit are very relevant for product formulation and quality control. Applications include structural characterization of materials within the nanometer range. This includes determination of symmetry, morphology, characteristic size, fractal dimension and surface area. These studies can be applied to liquid crystals, micellar aggregates, mesoporous materials, nanoparticles, proteins and nanostructured films. Also characterization of the porosity and surface area of nanoparticles, macroporous, macro/mesoporous and mesoporous materials like aluminas, silicas and other materials including M41S materials (eg. MCM-41), PMOs, KITs and many SBAs.
Target customer
Public research organizations, academia and industry in the pharmaceutical, chemical, food and cosmetic sectors.
Additional information
More information can be found at https://www2.iqac.csic.es/qci/