Detection of secondary ions by time-of-flight mass spectrometry service (TOF-SIMS)
This service employs one of the most powerful techniques at the level of detection and resolution both laterally and in depth for chemical composition measurements on surfaces and depth on thin films, such as TOF-SIMS or detection of secondary ions by time-of-flight mass spectrometry. In this way, the chemical composition of different materials can be tracked to form 2D and 3D conformational depth mappings or profiles of the system under study. In addition, the service allows surface analysis of organic and inorganic materials by obtaining mass spectra, mapping of chemical elements present on the surface of the sample by imaging and depth profile analysis.
Customer benefits
The instruments are located in the Research Support Services, specifically in the Analysis and Characterisation of Solids and Surfaces Service. Within the service there is a Doctor responsible for the instruments, in charge of their management and handling, as well as optimising their use as much as possible.
Target customer
Being located within the Research Support Services, it allows full access to the instruments (handled by a specialist in the technique) to the entire scientific community, both at the University of Extremadura and other public and private organisations.
Additional information
