U16. Surface Characterisation and Bacterial Colonization Unit

U16-S01. X-ray photoelectron spectroscopy service

X-ray photoelectron spectroscopy service

This service provides quantitative surface chemical elemental composition of a wide range of materials by X-ray photoelectron spectroscopy (XPS). In addition to obtaining the elemental composition of the surface of the materials studied, it is possible to determine their chemical state and the overall electronic structure and density of electronic states of the material. Using this technique, it is possible to check which elements are present on the surface of the material, as well as to which other elements they are bonded. In addition, this service offers the possibility of depth profiling when combined with ion beam etching.

Customer benefits

The instruments are located in the Research Support Services, specifically in the Analysis and Characterisation of Solids and Surfaces Service. Within the service there is a Doctor responsible for the instruments, in charge of their management and handling, as well as optimising their use as much as possible.

Target customer

Being located within the Research Support Services, it allows full access to the instruments (handled by a specialist in the technique) to the entire scientific community, both at the University of Extremadura and other public and private organisations.

Additional information

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U16-S04. Detection of secondary ions by time-of-flight mass spectrometry service (TOF-SIMS)

Detection of secondary ions by time-of-flight mass spectrometry service (TOF-SIMS)

This service employs one of the most powerful techniques at the level of detection and resolution both laterally and in depth for chemical composition measurements on surfaces and depth on thin films, such as TOF-SIMS or detection of secondary ions by time-of-flight mass spectrometry. In this way, the chemical composition of different materials can be tracked to form 2D and 3D conformational depth mappings or profiles of the system under study. In addition, the service allows surface analysis of organic and inorganic materials by obtaining mass spectra, mapping of chemical elements present on the surface of the sample by imaging and depth profile analysis.