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U16. Surface Characterisation and Bacterial Colonization Unit – Equipment

U16. Surface Characterisation and Bacterial Colonization Unit – Equipment

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U16-E07. Equipment for microbiology tests on materials. OUTSTANDING

Description: It is the set of precise elements to carry out microbiological tests with materials. Includes laminar flow adhesion chambers, Robbin devices, shaker and drip bioreactors, fluorescence microscopes, plate readers, ovens, autoclaves, etc.

Technical specifications: Allows quantifications on different types of systems. Depending on the specific conditions, it is possible to evaluate behavior in extensive solid materials or in suspension.

Applications: The services that can be provided with this equipment are:
Evaluation of the adhesion capacities and formation of biolayers of microorganisms on materials. Evaluation of bactericidal and/or bacteriostatic responses of materials.

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U16-E06. 3D Optical Surface Metrology System Leica DCM8 -Optical Profilometer- OUTSTANDING

FICTS-1420-14-09 3. Optical profilometer

3D Optical Surface Metrology System Leica DCM8

This equipment allows measuring the roughness of a multitude of samples by means of a non-destructive optical method. Based on the operation of a confocal microscope, it allows the creation of high-resolution 3D images in a fast and automatic way as well as obtaining color images thanks to the use of three LEDs: Red, Green and Blue. In addition, this system also works as an interferometer that allows to measure the roughness with greater precision of mirror polished samples.

Profilometry_EN-1Download

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U16-E05. DROP SHAPE ANALYZER – DSA100E (Remote) OUTSTANDING

FICTS-1420-14-09 4. Goniometer

DROP SHAPE ANALYZER – DSA100E

The system measures the contact angle between a liquid and a solid. Offers the possibility of measuring static, advancing and receding contact angle, as well as contact angle hysteresis by a tilting table. Also, measurement of surface tension and liquid-liquid interfacial tension using the Pendant Drop method can be obtained. Thanks to tempering and humidity chambers, this equipment can realistically reproduce individual process conditions, by making measurements under controlled humidity and temperature from 5 to 90 °C.


Goniometer_EN-1Download

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U16-E04. ToF-SIMS 5 Time-of-flight secondary-ion mass spectrometry system (ION TOF )

ToF-SIMS 5 Time-of-flight secondary-ion mass spectrometry system (ION TOF ).

•• Sensitivity < 100 ppm.
•• Lateral resolution ~ 100 nm (extension of surface area analyzed).
•• Depth resolution ~ 1 nm (thickness of surface analyzed).
•• Identification of molecules up to 10000 amu.

TOFSIMS_EN-2Download

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U16-E03. X-ray Photoelectron Spectrometer, FlexPS-ARPES-E

X-ray Photoelectron Spectrometer, FlexPS-ARPES-E

Description

X-ray photoelectron spectroscopy, known as XPS or ESCA, is one of the most widely used surface analysis techniques due to the high analytical value of its results and its flexibility in being applied to a wide variety of samples. In this regard, the surface information it provides is highly relevant, as basic XPS analysis offers qualitative and quantitative information on all the elements present on the surface of the studied material, except for hydrogen (H) and helium (He). Additionally, more comprehensive studies can provide detailed information about the surface’s chemistry, organization, and morphology.

Technical Specifications:

The FlexPS-ARPES-E system (SPECS) includes a UHV (ultra-high vacuum) chamber designed with a geometry that allows for the combination of the most common electronic and ionic spectroscopy applications, such as XPS, SEM/SAM (Scanning Electron/Auger scpetroscopy), UPS (Ultraviolet Photoelectron Spectroscopy), and ISS (Ion Scattering Spectroscopy). Therefore, this equipment not only allows for the collection of complete and high-resolution spectra but also includes technology for performing angle-resolved studies on layers and thin films. It also features Auger technology in SEM/SAM for acquiring elemental mappings with high lateral resolution and includes pre-chambers for thermal and gaseous treatments, enabling in situ studies of materials under their real operating conditions.

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